書誌事項
- タイトル別名
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- Precise measurement of linear displacement by spatial phase detection.
- クウカンテキ イソウ ケンシュツホウ ニ ヨル コウ セイド ヘンイ ソクテイ
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説明
Linear displacement in the range of millimeter to nanometer is determined by measuring phase variation of a one-dimensional periodic pattern such as a Ronchi grating, moiré fringes, and interference fringes. Phase variation is precisely determined by sinusoidal fitting whose algorithm is the same as that of phase detection which is well-known in communication techniques. Hardware system is quite simple which consists of a linear image sensor, a general purpose microcomputer, and required peripheral interface circuits. Errors inherent in the method is discussed in detail. Phase errors experimentally obtained in a Ronchi grating, moiré fringes, and interference fringes are 0.029 rad, 0.057 rad, and 0.068 rad, respectively.
収録刊行物
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- 精密工学会誌
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精密工学会誌 52 (9), 1573-1578, 1986
公益社団法人 精密工学会
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詳細情報 詳細情報について
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- CRID
- 1390282679772876288
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- NII論文ID
- 110001368928
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- NII書誌ID
- AN1003250X
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- ISSN
- 1882675X
- 09120289
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- NDL書誌ID
- 3100630
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- 本文言語コード
- ja
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- データソース種別
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- JaLC
- NDLサーチ
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