書誌事項
- タイトル別名
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- Convenient Method of X-Ray Absorption Spectroscopy Using EPMA
- EPMA ニ ヨル Xセン キュウシュウ スペクトル カンイ ソクテイホウ
この論文をさがす
抄録
Fine structures in X-ray fluorescence spectra are explained from the view point of trace analysis. Among these fine structures, the physical processes of the X-ray Raman and radiative Auger effects are explained in detail. The similarity between the radiative Auger effect and X-ray absorption fine structures (XAFS) are described. A novel method to measure the XAFS spectra using the radiative Auger effect is explained; this method has been named EXEFS. Various numerical results of EXEFS Fourier analysis are described with the change of parameters in the numerical analysis. A potential of applying EXEFS method to microbeam analysis is reviewed.
収録刊行物
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- 鉄と鋼
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鉄と鋼 85 (5), 353-361, 1999
一般社団法人 日本鉄鋼協会
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詳細情報 詳細情報について
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- CRID
- 1390282680160344960
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- NII論文ID
- 110001457069
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- NII書誌ID
- AN00151251
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- ISSN
- 18832954
- 00211575
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- NDL書誌ID
- 4720361
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- データソース種別
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- JaLC
- NDL
- Crossref
- CiNii Articles
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- 抄録ライセンスフラグ
- 使用不可