光学的手法による微細構造体の面内変位計測

書誌事項

タイトル別名
  • Optical Method for Measuring In-plane Micro Displacement of Micro-device
  • コウガクテキ シュホウ ニ ヨル ビサイ コウゾウタイ ノ メン ナイ ヘンイ ケイソク

この論文をさがす

説明

In this paper, a novel method for measuring nanometer order in-plane displacement of mechanical element in MEMS device will be proposed. Present method is based on the measurement of reflected light intensity irradiated on the edge of measuring target, where the work stage is traversed in the direction of displacement of the mechanical element, under applying AC vibration parallel to the direction of displacement of the element. By applying this method, measurement of displacement under 10 nm can be achieved.

収録刊行物

被引用文献 (1)*注記

もっと見る

参考文献 (6)*注記

もっと見る

詳細情報 詳細情報について

問題の指摘

ページトップへ