Numerical Simulation of Liquid Crystalline Flow Induced by Defect Annihilation

DOI

Bibliographic Information

Other Title
  • 液晶欠陥対消滅が誘起する流れの数値シミュレーション

Abstract

The numerical simulations of the liquid crystalline flow induced by defect annihilation have been achieved using the Doi theory coupled with Marrucci-Greco potential. The orientation probability density function is expanded in terms of spherical harmonic function, to reduce the computational task. It is well-known that the defects with different types of molecular orientation configuration attract each other, and finally annihilate. In this defect annihilation process, the liquid crystalline flow will arise through the rotation of the molecular orientation direction. From the numerical results, it is found that the induced velocity increases as the two defects come closer.

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Details 詳細情報について

  • CRID
    1390282680570892928
  • NII Article ID
    130004603760
  • DOI
    10.11345/japannctam.56.0.255.0
  • Text Lang
    ja
  • Data Source
    • JaLC
    • CiNii Articles
  • Abstract License Flag
    Disallowed

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