Numerical Simulation of Liquid Crystalline Flow Induced by Defect Annihilation
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- Kuroiwa Masahiro
- Kochi University of Technology
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- Tsuji Tomohiro
- Kochi University of Technology
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- Chono Shigeomi
- Kochi University of Technology
Bibliographic Information
- Other Title
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- 液晶欠陥対消滅が誘起する流れの数値シミュレーション
Description
The numerical simulations of the liquid crystalline flow induced by defect annihilation have been achieved using the Doi theory coupled with Marrucci-Greco potential. The orientation probability density function is expanded in terms of spherical harmonic function, to reduce the computational task. It is well-known that the defects with different types of molecular orientation configuration attract each other, and finally annihilate. In this defect annihilation process, the liquid crystalline flow will arise through the rotation of the molecular orientation direction. From the numerical results, it is found that the induced velocity increases as the two defects come closer.
Journal
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- NCTAM papers, National Congress of Theoretical and Applied Mechanics, Japan
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NCTAM papers, National Congress of Theoretical and Applied Mechanics, Japan 56 (0), 255-255, 2007
National Committee for IUTAM
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Keywords
Details 詳細情報について
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- CRID
- 1390282680570892928
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- NII Article ID
- 130004603760
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- Text Lang
- ja
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- Data Source
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- JaLC
- CiNii Articles
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- Abstract License Flag
- Disallowed