Optical measurement system of spindle run-out using virtual V-block method

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Bibliographic Information

Other Title
  • 光学式仮想Vブロック方式を用いたスピンドル回転誤差測定システム

Abstract

Run-out measuring instruments with capacitance displacement probe are widely used in industry. However,this measurement method has the defect that measurement result depends on a feature of measured object. Furthermore,in measurement at one section the attachment errors such as eccentric and tilt of measured object are never detected. We compare the optical 3-point measurement by virtual V-block method which does not depend on a feature of a measured object to the 2-point measurement with capacitance displacement probe in view of measurement principle. And we show how to separate the attachment error from the run-out error of spindle.

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Details 詳細情報について

  • CRID
    1390282680628300800
  • NII Article ID
    130004657755
  • DOI
    10.11522/pscjspe.2005s.0.625.0
  • Data Source
    • JaLC
    • CiNii Articles
    • KAKEN
  • Abstract License Flag
    Disallowed

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