Optical measurement system of spindle run-out using virtual V-block method
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- Yamada Ryuichi
- Nagaoka National College of Technolpgy
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- Ishida Tetsugo
- Nagaoka University of Technology
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- Yanagi Kazuhisa
- Nagaoka University of Technology
Bibliographic Information
- Other Title
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- 光学式仮想Vブロック方式を用いたスピンドル回転誤差測定システム
Description
Run-out measuring instruments with capacitance displacement probe are widely used in industry. However,this measurement method has the defect that measurement result depends on a feature of measured object. Furthermore,in measurement at one section the attachment errors such as eccentric and tilt of measured object are never detected. We compare the optical 3-point measurement by virtual V-block method which does not depend on a feature of a measured object to the 2-point measurement with capacitance displacement probe in view of measurement principle. And we show how to separate the attachment error from the run-out error of spindle.
Journal
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- Proceedings of JSPE Semestrial Meeting
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Proceedings of JSPE Semestrial Meeting 2005S (0), 625-625, 2005
The Japan Society for Precision Engineering
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Details 詳細情報について
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- CRID
- 1390282680628300800
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- NII Article ID
- 130004657755
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- Data Source
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- JaLC
- CiNii Articles
- KAKEN
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- Abstract License Flag
- Disallowed