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Development of spectroscopic ellipsometry with dual-optical-comb spectroscopy
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- Minamikawa Takeo
- Graduate School of Technology, Industrial and Social Sciences
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- Hsieh Yi-Da
- Graduate School of Technology, Industrial and Social Sciences
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- Shibuya Kyuki
- Graduate School of Advanced Technology and Science
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- Hase Eiji
- Bio- and Soft-materials Group, Research & Utilization Division
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- Kaneoka Yoshiki
- Graduate School of Advanced Technology and Science
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- Okubo Sho
- National Metrology Institute of Japan
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- Inaba Hajime
- National Metrology Institute of Japan
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- Mizutani Yasuhiro
- Graduate School of Engineering
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- Yamamoto Hirotsugu
- 宇都宮大 オプティクス教育研究センター
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- Iwata Tetsuo
- Graduate School of Technology, Industrial and Social Sciences
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- Yasui Takeshi
- Graduate School of Technology, Industrial and Social Sciences
Bibliographic Information
- Other Title
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- デュアル光コム分光法を用いた分光エリプソメトリーの開発
Description
In this report, we demonstrated a new methodology of spectroscopic ellipsometry employing dual-optical-comb spectroscopy, namely dual-optical-comb spectroscopic ellipsometry (DCSE). The DCSE provides fast ellipsometric evaluation with high-spectral accuracy and resolution, wide spectral bandwidth and without any mechanical movements for both the polarization analysis and spectral decoding, which has a big leap in performance of spectroscopic ellipsometry. We performed the DCSE evaluation of birefringent materials and thin films with the spectral accuracy and resolution up to 1.2x10^-5 nm (1.5 MHz) over 5-10 THz spectral bandwidth.
Journal
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- Proceedings of JSPE Semestrial Meeting
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Proceedings of JSPE Semestrial Meeting 2017A (0), 981-982, 2017
The Japan Society for Precision Engineering
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Details 詳細情報について
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- CRID
- 1390282680634619136
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- NII Article ID
- 130006434610
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- Text Lang
- ja
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- Data Source
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- JaLC
- CiNii Articles
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- Abstract License Flag
- Disallowed