Evaluation of eletrical dynamic responce of Liquid Crystal orientation by ellipsometry
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- Takemi Naoki
- Dept.of Electrical Engi., Nagaoka Univ. of Tech.
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- Watanabe Katuaki
- Dept.of Electrical Engi., Nagaoka Univ. of Tech.
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- Okutani Satoshi
- Dept.of Electrical Engi., Nagaoka Univ. of Tech.
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- Kimura Munehiro
- Dept.of Electrical Engi., Nagaoka Univ. of Tech.
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- Akahane Tadashi
- Dept.of Electrical Engi., Nagaoka Univ. of Tech.
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- Toriumi Hirokazu
- Dept. of Chemistry, Univ of Tokyo
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- Tadokoro Toshiyasu
- Spectroscopic Instrument Division, JASCO Corporation
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- Akao Kenichi
- Spectroscopic Instrument Division, JASCO Corporation
Bibliographic Information
- Other Title
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- 1-8b 偏光解析法を用いた液晶配向の動的電場応答の評価
Description
The dye-doped reflection ellipsometry is effective method to investigate the behavior of Liquid Crystal director at the interface between LC and alignment film. For the quantitative estimate of the polar anchoring strength of LC cells, it is important to analyze the optical parameters(thickness, refractive index) of the alignment film, ITO film and glass substrate. We mesured these optical parameters and electrical dynamic responce of LC cells. Dye doped ellipsometry allows to estimate the polar anchoring strength quantitatively by comparing exprimental results with thoretical ones.
Journal
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- Proceedings of Japanese Liquid Crystal Society Annual meeting
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Proceedings of Japanese Liquid Crystal Society Annual meeting 1998 (0), 112-113, 1998
THE JAPANESE LIQUID CRYSTAL SOCIETY
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Details 詳細情報について
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- CRID
- 1390282680664694272
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- NII Article ID
- 110001464068
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- ISSN
- 24325988
- 18803490
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- Text Lang
- ja
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- Data Source
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- JaLC
- CiNii Articles
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- Abstract License Flag
- Disallowed
