書誌事項
- タイトル別名
-
- Development of Impact Sensor Using Silicon Strain Gauge
抄録
<p>A strain sensor which can monitor the change of local stress distribution in 3-D stacked structures was developed by applying the piezoresistive effect of single-crystalline silicon. The sensor was embedded in a silicon chip, and it measured the impact effect for the chip during the manufacturing and operating process of electronic products. The strain dependence of the electrical conductivity of the sensor was evaluated. Fabricated sensor showed liner voltage-current characteristics and the gauge factor of about 100.</p>
収録刊行物
-
- M&M材料力学カンファレンス
-
M&M材料力学カンファレンス 2016 (0), PS-06-, 2016
一般社団法人 日本機械学会
- Tweet
詳細情報 詳細情報について
-
- CRID
- 1390282680849189376
-
- NII論文ID
- 130007121904
-
- ISSN
- 24242845
-
- 本文言語コード
- ja
-
- データソース種別
-
- JaLC
- Crossref
- CiNii Articles
-
- 抄録ライセンスフラグ
- 使用不可