Highly Oxidation-Resistant TiN Barrier Layers for Ferroelectric Capacitors.
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- Matsui Yuichi
- Central Research Laboratory, Hitachi, Ltd., 1–280, Higashi–koigakubo, Kokubunji–shi, Tokyo 185, Japan
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- Torii Kazuyoshi
- Central Research Laboratory, Hitachi, Ltd., 1–280, Higashi–koigakubo, Kokubunji–shi, Tokyo 185, Japan
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- Kushida Keiko
- Central Research Laboratory, Hitachi, Ltd., 1–280, Higashi–koigakubo, Kokubunji–shi, Tokyo 185, Japan
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- Miki Hiroshi
- Central Research Laboratory, Hitachi, Ltd., 1–280, Higashi–koigakubo, Kokubunji–shi, Tokyo 185, Japan
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- Fujisaki Yoshihisa
- Central Research Laboratory, Hitachi, Ltd., 1–280, Higashi–koigakubo, Kokubunji–shi, Tokyo 185, Japan
書誌事項
- タイトル別名
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- Highly Oxidation-Resistant TiN Barrier
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抄録
The characteristics of TiN film, which is well suited for use as the barrier layer of ferroelectric capacitors, were investigated. It was found that high-density TiN is more resistive against oxidation than low-density one. It was also revealed that the < 200> -oriented TiN had higher oxidation resistance than the < 111> -oriented one. However, whereas a thick Pt bottom electrode was previously used to prevent barrier layer oxidation, we found that the Pt thickness can be reduced to less than half with high-density < 200> -oriented TiN. TiN oxidation followed the linear-oxidation law (a reaction-limited process) in the initial stage of oxidation, and the oxidation rate was found to be inversely proportional to the density and proportional to the etching rate. The etching rate of the < 200> -oriented TiN was lower than that of the < 111> -oriented TiN, indicating that (100) was less reactive than (111). Consequently, the < 200> -oriented TiN film exhibited high oxidation resistance.
収録刊行物
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- Japanese Journal of Applied Physics
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Japanese Journal of Applied Physics 36 (3B), 1586-1588, 1997
The Japan Society of Applied Physics
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詳細情報 詳細情報について
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- CRID
- 1390282681224403712
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- NII論文ID
- 110003946847
- 130004523471
- 210000040819
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- NII書誌ID
- AA10457675
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- ISSN
- 13474065
- 00214922
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- NDL書誌ID
- 4196672
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- 本文言語コード
- en
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- データソース種別
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- JaLC
- NDL
- Crossref
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- 抄録ライセンスフラグ
- 使用不可