Dynamic Behavior of Tungsten Surfaces due to Simultaneous Impact of Hydrogen and Carbon Ion Beam
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- Kawakami Retsuo
- Faculty of Engineering, The University of Tokushima
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- Shimada Tomohisa
- Graduate School of Engineering, Osaka University
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- Ueda Yoshio
- Graduate School of Engineering, Osaka University
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- Nishikawa Masahiro
- Graduate School of Engineering, Osaka University
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説明
By using a simulation code for ion-solid interactions, EDDY, the dynamical behavior of W surfaces irradiated simultaneously with H+ and C+ impurity has been studied. This code models the fluence evolution of composition changes between C and W at the irradiated surface, which results from sputtering erosion and impurity deposition. The result has been described in terms of C impurity concentration in the irradiation. It has been compared with experimental data obtained by an ion beam irradiation device. In particular, the C impurity concentration has an important role in erosion/deposition at the W surface. As the C impurity concentration increases, the erosion is enhanced. As the C impurity concentration exceeds 3.00%, there is a transition from erosion to deposition which is due to the formation of a C film on the W surface. Regarding the result that the erosion changes to deposition, the simulation qualitatively reproduces the experimental results measured by X-ray photoemission spectroscopy (XPS). There is a different tendency in the fluence dependence for the different C impurity concentrations. For C:0.11%, the erosion rate increases with increasing fluence. This results from a growth of a local peak at around a depth of 20 nm in the depth profile of the deposited C. The growth is in good agreement with the experimental result, which shows that there is a strong contribution from recoil implantation of the deposited C due to a synergetic effect of the H and C impurity. For C:0.84%, there are almost the same tendencies as for C:0.11% in the erosion rate and in the depth profile. However, the growth of the local peak at around a depth of 10 nm is in disagreement with the measured one, which occurs near the surface. The disagreement appears to be attributable to the contribution of the surface segregation.
収録刊行物
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- Japanese Journal of Applied Physics
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Japanese Journal of Applied Physics 42 (12), 7529-7535, 2003
The Japan Society of Applied Physics
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詳細情報 詳細情報について
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- CRID
- 1390282681243152128
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- NII論文ID
- 130004530206
- 10011840998
- 210000054542
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- NII書誌ID
- AA10457675
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- ISSN
- 13474065
- 00214922
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- NDL書誌ID
- 6786154
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- 本文言語コード
- en
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- データソース種別
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- NDLサーチ
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