書誌事項
- タイトル別名
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- Relationship between resolution and rotation stage in imaging X-ray CT
- ケツゾウガタ Xセン CT ニ オケル カイテン ステージ ト ブンカイノウ ノ カンケイ
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説明
In this study, evaluation of precision in rotation stage and investigation of effect of rotation stage blurring on resolution are performed in imaging X-ray tomography set-up, which allows nano-scale observation, for the purpose of improving resolution in X-ray tomography. In the result of precision evaluation of rotation stage in high-resolution imaging X-ray tomography, fluctuation, which was approximately 35 nm in maximum and approximately 13 nm in average, was found. This fluctuation was under 1 pixel. In the simulation that analyzed effect of fluctuation in rotation stage, it was found that long periodic fluctuation deteriorate reconstructed image terribly. But, impulse-like fluctuation does not almost affect reconstructed image quality. However, reconstructed image is deteriorated when the frequency of impulse-like fluctuation increase. If long periodic fluctuation, which was observed in the precision evaluation, is corrected, the resolution improvement was confirmed though the fluctuation was less than 1 pixel.
収録刊行物
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- 軽金属
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軽金属 63 (8), 273-278, 2013
一般社団法人 軽金属学会
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詳細情報 詳細情報について
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- CRID
- 1390282681316437504
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- NII論文ID
- 130004775035
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- NII書誌ID
- AN00069773
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- ISSN
- 18808018
- 04515994
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- NDL書誌ID
- 024782615
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- 本文言語コード
- ja
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- データソース種別
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- JaLC
- NDL
- Crossref
- CiNii Articles
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- 抄録ライセンスフラグ
- 使用不可
