書誌事項
- タイトル別名
-
- Formation of High-Quality Passivation Films for Solar Cells by Cat-CVD
- ショクバイ カガク キソウ タイセキ(Cat-CVD)ホウ ニ ヨル タイヨウ デンチヨウ コウヒンシツ パッシベーションマク ノ ケイセイ
この論文をさがす
抄録
<p>Back-contact c-Si solar cells can realize superior performance due to no shadowing loss. Surface passivation with excellent quality is required for achieving sufficient conversion efficiency in the back-contact cells. Cat-CVD can produce high-quality passivation films owing to its plasma-damage-less nature. SiNx deposition at a low temperature and successive post annealing leads to a surface recombination velocity (SRV) of < 5 cm/s. The exposure of c-Si wafers to catalytically generated phosphorus radicals can form ultra-thin highly-doped layers (Cat-doping). This P-doped region acts to reduce an SRV to < 2 cm/s by combining with a Cat-CVD SiNx film. We have also established the passivation of rear c-Si surfaces by Cat-CVD a-Si with suppressing epitaxial growth by introducing ultra-thin oxide layers formed by dipping in H2O2. The formation of doped a-Si by Cat-doping has also been demonstrated, which will be applicable to the formation of patterned doping regions in Si heterojunction back-contact cells.</p>
収録刊行物
-
- 表面科学
-
表面科学 38 (5), 234-239, 2017
公益社団法人 日本表面科学会
- Tweet
キーワード
詳細情報 詳細情報について
-
- CRID
- 1390282681436077568
-
- NII論文ID
- 130007332061
- 40021215911
-
- NII書誌ID
- AN00334149
-
- ISSN
- 18814743
- 03885321
-
- NDL書誌ID
- 028223314
-
- 本文言語コード
- ja
-
- データソース種別
-
- JaLC
- NDL
- Crossref
- CiNii Articles
-
- 抄録ライセンスフラグ
- 使用不可