書誌事項
- タイトル別名
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- Melting and Recrystallization Behavior of Polytetrafluoroethylene
- ポリテトラフルオロエチレンセイ テープ ノ ユウカイ サイケッショウジ ノ キ
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抄録
To clarify the structure of polytetrafluoroethylene (PTFE), a raw film made by compressing and rolling PTFE dispersion particles was examined using thermal analysis, X-ray diffraction and electron microscopy. In the PTFE raw film, granular PTFE particles are in contact with one another; wideangle X-ray diffraction shows their orientation. This orientation diminishes during sinering, but a clearer orientation reappears by cooling. The band structure with striations aligned parallel to the rolled direction appears on the fracture surface for samples prepared at low cooling rates. As the sintering time becomes longer, the oriented structure changes into an unoriented structure. Thermomechanical analysis shows that the PTFE maintains its‘memories’of before it was sintered, even in the melt, for a long time. To clear the ‘memories’ thoroughly, sintering at 450°C, or at 370°C for a longer time than 2hrs is necessary for the raw film.
収録刊行物
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- 高分子論文集
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高分子論文集 40 (6), 383-391, 1983
公益社団法人 高分子学会
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詳細情報 詳細情報について
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- CRID
- 1390282681499166336
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- NII論文ID
- 130004034127
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- NII書誌ID
- AN00085011
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- ISSN
- 18815685
- 03862186
- http://id.crossref.org/issn/03862186
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- NDL書誌ID
- 2596613
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- 本文言語コード
- ja
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- データソース種別
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- JaLC
- NDL
- Crossref
- CiNii Articles
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- 抄録ライセンスフラグ
- 使用不可