Development of Z<sub>eff</sub> Imaging Using X-ray Interferometer

DOI Web Site

Bibliographic Information

Other Title
  • X線干渉計を用いたZ<sub>eff</sub>イメージング法の開発
  • X線干渉計を用いたZeffイメージング法の開発
  • Xセン カンショウケイ オ モチイタ Zeff イメージングホウ ノ カイハツ

Search this article

Abstract

<p>A novel Zeff imaging using X-ray interferometer has been developed. Since the effective atomic number (Zeff) corresponds to the ratio of the real to imaginary part of the complex refractive index, an elemental map is calculable with the ratio of an absorption and phase-contrast image. Several metal foils underwent feasibility observations by crystal X-ray interferometry. The obtained Zeff image shows that aluminum, iron, nickel, and copper foil were clearly distinguished, and nickel and copper’s Zeff values coincide with ideal Z number within 5%.</p>

Journal

  • KENBIKYO

    KENBIKYO 50 (1), 67-70, 2015-04-30

    The Japanese Society of Microscopy

Keywords

Details 詳細情報について

Report a problem

Back to top