Low-Temperature Bonding of Copper by Copper Electrodeposition

この論文をさがす

説明

<p>Bonding copper in the solid state requires either a high temperature, large deformation, or high vacuum. In the present study, copper was butt-bonded using a K-shaped groove at 298 K under no bonding pressure through copper electrodeposition. The initial gap between the faying surfaces of the copper rods were gradually filled with the electrodeposition of copper from the center to the periphery. No significant defects were observed in the bond layer, and a high joint strength of approximately 240 MPa was obtained. There were three regions in the bond layer: fine columnar grain region, ultrafine grain region, and recrystallized grain region. The size of the ultrafine grains was several tens of nanometers, and the microhardness was larger than that of the base metal. As electrodeposition progressed, there were insufficient additives for electrodeposition near the center of the bond layer, and recrystallization occurred owing to self-annealing.</p>

収録刊行物

  • MATERIALS TRANSACTIONS

    MATERIALS TRANSACTIONS 63 (6), 783-788, 2022-06-01

    公益社団法人 日本金属学会

被引用文献 (3)*注記

もっと見る

参考文献 (17)*注記

もっと見る

詳細情報 詳細情報について

問題の指摘

ページトップへ