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A Numerical Model of ReRAM Reliability based on Lattice Random Walk
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- Matsuda Shinpei
- Chuo Univ.
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- Takeuchi Ken
- Chuo Univ.
Bibliographic Information
- Other Title
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- 格子ランダムウォークに基づくReRAM信頼性の数値モデル
Journal
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- JSAP Annual Meetings Extended Abstracts
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JSAP Annual Meetings Extended Abstracts 2019.1 (0), 2783-2783, 2019-02-25
The Japan Society of Applied Physics
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Details 詳細情報について
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- CRID
- 1390293202185797504
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- ISSN
- 24367613
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- Text Lang
- ja
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- Data Source
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- JaLC
