High resolution imaging by electron-beam excitation assisted optical microscope with emission layer for a brighter nanometric light source
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- Masuda Yuriko
- Shizuoka Univ., Japan
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- Nawa Yasunori
- Shizuoka Univ., Japan
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- Morita Chiyu
- Shizuoka Univ., Japan
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- Kamiya Masashi
- Shizuoka Univ., Japan
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- Inami Wataru
- Shizuoka Univ., Japan
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- Miyake Aki
- Shizuoka Univ., Japan
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- Sugita Atsushi
- Shizuoka Univ., Japan
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- Kawata Yoshimasa
- Shizuoka Univ., Japan CREST, Japan Science and Technology Agency, Japan
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- Nakanishi Yoichiro
- Shizuoka Univ., Japan
Journal
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- JSAP Annual Meetings Extended Abstracts
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JSAP Annual Meetings Extended Abstracts 2013.2 (0), 4529-4529, 2013-08-31
The Japan Society of Applied Physics
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Details 詳細情報について
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- CRID
- 1390297039772446976
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- ISSN
- 24367613
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- Text Lang
- en
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- Data Source
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- JaLC