High resolution imaging by electron-beam excitation assisted optical microscope with emission layer for a brighter nanometric light source
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- Masuda Yuriko
- Shizuoka Univ., Japan
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- Nawa Yasunori
- Shizuoka Univ., Japan
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- Morita Chiyu
- Shizuoka Univ., Japan
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- Kamiya Masashi
- Shizuoka Univ., Japan
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- Inami Wataru
- Shizuoka Univ., Japan
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- Miyake Aki
- Shizuoka Univ., Japan
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- Sugita Atsushi
- Shizuoka Univ., Japan
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- Kawata Yoshimasa
- Shizuoka Univ., Japan CREST, Japan Science and Technology Agency, Japan
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- Nakanishi Yoichiro
- Shizuoka Univ., Japan
収録刊行物
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- 応用物理学会学術講演会講演予稿集
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応用物理学会学術講演会講演予稿集 2013.2 (0), 4529-4529, 2013-08-31
公益社団法人 応用物理学会