Nanoscale evaluation for the number of layers of few-layer hexagonal boron nitride with scattering-type scanning near-field optical microscopy
-
- TAKAMURA MAKOTO
- NTT Basic Res. Labs.
-
- Taniyasu Yoshitaka
- NTT Basic Res. Labs.
Bibliographic Information
- Other Title
-
- 数層h-BNの散乱型走査近接場光学顕微鏡によるナノスケール層数評価
Journal
-
- JSAP Annual Meetings Extended Abstracts
-
JSAP Annual Meetings Extended Abstracts 2020.2 (0), 2306-2306, 2020-08-26
The Japan Society of Applied Physics
- Tweet
Keywords
Details 詳細情報について
-
- CRID
- 1390573407640347648
-
- ISSN
- 24367613
-
- Text Lang
- ja
-
- Data Source
-
- JaLC