Carrier distribution imaging of mechanically exfoliated WSe<sub>2</sub>/SiO<sub>2</sub> and suspended WSe<sub>2 </sub>using scanning nonlinear dielectric microscopy
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- Takano Koki
- RIEC, Tohoku Univ.
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- Yamasue Kohei
- RIEC, Tohoku Univ.
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- Kato Toshiaki
- Tohoku Univ.
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- Kaneko Toshiro
- Tohoku Univ.
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- Cho Yasuo
- RIEC, Tohoku Univ.
Bibliographic Information
- Other Title
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- 走査型非線形誘電率顕微鏡による機械剥離WSe<sub>2</sub>/SiO<sub>2</sub>と架橋型WSe<sub>2</sub>のキャリア分布の観察
Journal
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- JSAP Annual Meetings Extended Abstracts
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JSAP Annual Meetings Extended Abstracts 2020.1 (0), 3477-3477, 2020-02-28
The Japan Society of Applied Physics
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Details 詳細情報について
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- CRID
- 1390573715144284160
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- ISSN
- 24367613
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- Text Lang
- ja
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- Data Source
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- JaLC