Third-Phase Evaluation of Minority Carrier Lifetime in FZ-Si Affected by Si-IGBT Process
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- Kobayashi Hiroto
- Meiji Univ.
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- Yokogawa Ryo
- Meiji Univ. JSPS Research Fellow DC
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- Kinoshita Kosuke
- Meiji Univ.
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- Numasawa Yohichiroh
- Meiji Univ.
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- Ogura Atsushi
- Meiji Univ.
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- Nishizawa Shin-ichi
- Kyushu Univ.
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- Saraya Takuya
- Univ. of Tokyo
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- Ito Kazuo
- Univ. of Tokyo
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- Takakura Toshihiko
- Univ. of Tokyo
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- Suzuki Shin-ichi
- Univ. of Tokyo
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- Fukui Munetoshi
- Univ. of Tokyo
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- Takeuchi Kiyoshi
- Univ. of Tokyo
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- Hiramoto Toshiro
- Univ. of Tokyo
Bibliographic Information
- Other Title
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- Si-IGBTプロセスによるFZ-Siの少数キャリアライフタイムへの影響評価-III-
Journal
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- JSAP Annual Meetings Extended Abstracts
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JSAP Annual Meetings Extended Abstracts 2019.1 (0), 2757-2757, 2019-02-25
The Japan Society of Applied Physics
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Keywords
Details 詳細情報について
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- CRID
- 1390574677162454656
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- ISSN
- 24367613
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- Text Lang
- ja
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- Data Source
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- JaLC