書誌事項
- タイトル別名
-
- Effect of Surface Treatment in Au/Ni/ n-GaN Schottky Contacts Formed on Cleaved m-Plane Surfaces of Free-Standing n-GaN Substrates
抄録
<p>We fabricated and characterized Au/Ni Schottky contacts on cleaved m-plane free-standing n-GaN surfaces (i) without any surface treatment, (ii) with H2O2 treatment, or (iii) with HCl treatment by current-voltage (I-V), capacitance-voltage (C-V), and photoresponse (PR) measurements. 50-nm-thick Ni films and 50-nm-thick Au films were deposited in turn on the m-plane surface by electron-beam evaporation to form Schottky contacts. All of the Schottky contacts were circular and 100µm in diameter. The highest step determined by the laser microscope was 5 nm, but in some dots, steps were not observed. The as-cleaved samples showed I-V characteristics with small n-values and less diode-to-diode variation. However, the H2O2 samples had much smaller Schottky barrier height (qϕB). Whereas the HCl samples exhibited significantly large diode-to-diode variation. The qϕB and n-values obtained from the I-V, C-V, and PR results are nearly constant, independent of the step height. This is probably because the steps also consist of m-plane facets, which have no effect on the electrical characteristics of the Schottky diodes. It is confirmed that cleaving without any surface treatment can provide a cleaner surface to form Schottky diodes on m-plane n-GaN surfaces than that with conventional HCl treatment.</p>
収録刊行物
-
- 材料
-
材料 71 (10), 819-823, 2022-10-15
公益社団法人 日本材料学会
- Tweet
詳細情報 詳細情報について
-
- CRID
- 1390575285352290816
-
- ISSN
- 18807488
- 05145163
-
- 本文言語コード
- ja
-
- データソース種別
-
- JaLC
- Crossref
- KAKEN
-
- 抄録ライセンスフラグ
- 使用不可