書誌事項
- タイトル別名
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- Ultrahigh-resolution Magnetic Field Imaging by Magnetic-field-free Atomic Resolution Electron Microscopy
- ゲンシ ブンカイノウ ジバ フリー デンシ ケンビキョウ ニ ヨル チョウコウブンカイノウ ジバ カンサツ
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<p>With conventional atomic-resolution electron microscopes, atomic-scale observation of magnetic materials has been extremely difficult since the samples are inevitably placed in a strong magnetic field of 2 T or higher. To overcome this limitation, we have developed a new objective lens system that enables atomic-resolution observation while maintaining a sample in the magnetic field-free environment. The electron microscope with this new lens system facilitates atomic structure analysis of magnetic materials and is expected to enable ultra-high resolution magnetic field imaging inside materials and devices. In this review, we describe the development of elemental technologies for the Magnetic field-free Atomic-Resolution Scanning transmission electron microscope (MARS) and show the results of real-space observation of the atomic-scale magnetic field distribution inside antiferromagnetic hematite.</p>
収録刊行物
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- 表面と真空
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表面と真空 66 (12), 683-688, 2023-12-10
公益社団法人 日本表面真空学会
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詳細情報 詳細情報について
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- CRID
- 1390579908258733184
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- NII書誌ID
- AA12808657
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- ISSN
- 24335843
- 24335835
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- NDL書誌ID
- 033228039
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- 本文言語コード
- ja
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- データソース種別
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- JaLC
- NDL
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- 抄録ライセンスフラグ
- 使用不可