Nanoscale Structural Characterizations of 2D Materials Using Low-energy Electron Microscopy

DOI

Bibliographic Information

Other Title
  • 低エネルギー電子顕微鏡を用いた二次元物質のナノスケール構造解析

Description

<p>Low-energy electron microscopy (LEEM) is a powerful tool for investigating the structures of 2D materials at the nanoscale. In this paper, following a review of structural information obtained from LEEM characterizations, the growth of hexagonal boron nitride (hBN) and its heterostructures with graphene is investigated in detail using LEEM. We have demonstrated that unidirectional hBN islands grow on inclined Cu(101) surfaces, and that the orientation of these islands changes in response to the orientation of steps on the vicinal Cu(101) surface. This indicates that the Cu substrate steps play a key role in determining the orientation of hBN. Additionally, we have successfully controlled the growth of both lateral and vertical heterostructures of graphene and hBN on Cu substrates by adjusting the supply sequence of their precursors.</p>

Journal

  • Vacuum and Surface Science

    Vacuum and Surface Science 68 (2), 97-104, 2025-02-10

    The Japan Society of Vacuum and Surface Science

Keywords

Details 詳細情報について

  • CRID
    1390584642184034432
  • DOI
    10.1380/vss.68.97
  • ISSN
    24335843
    24335835
  • Text Lang
    ja
  • Data Source
    • JaLC
  • Abstract License Flag
    Disallowed

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