低エネルギー電子顕微鏡を用いた二次元物質のナノスケール構造解析

日比野 浩樹, Shengnan Wang, 影島 博之

doi:10.1380/vss.68.97

書誌事項

タイトル別名

Nanoscale Structural Characterizations of 2D Materials Using Low-energy Electron Microscopy

説明

<p>Low-energy electron microscopy (LEEM) is a powerful tool for investigating the structures of 2D materials at the nanoscale. In this paper, following a review of structural information obtained from LEEM characterizations, the growth of hexagonal boron nitride (hBN) and its heterostructures with graphene is investigated in detail using LEEM. We have demonstrated that unidirectional hBN islands grow on inclined Cu(101) surfaces, and that the orientation of these islands changes in response to the orientation of steps on the vicinal Cu(101) surface. This indicates that the Cu substrate steps play a key role in determining the orientation of hBN. Additionally, we have successfully controlled the growth of both lateral and vertical heterostructures of graphene and hBN on Cu substrates by adjusting the supply sequence of their precursors.</p>

収録刊行物

表面と真空

表面と真空 68 (2), 97-104, 2025-02-10

公益社団法人日本表面真空学会

キーワード

詳細情報詳細情報について

CRID: 1390584642184034432

DOI: 10.1380/vss.68.97

ISSN: 24335843; 24335835

本文言語コード: ja

データソース種別

JaLC

抄録ライセンスフラグ: 使用不可

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