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The Analysis method of printed circuits bord using Lock-in thermal emisshition microscop
Bibliographic Information
- Other Title
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- ロックイン発熱解析(LIT)を用いた実装基板の解析手法
- ロックイン ハツネツ カイセキ(LIT)オ モチイタ ジッソウ キバン ノ カイセキ シュホウ
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Journal
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- Proceedings of Microelectronics Symposium
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Proceedings of Microelectronics Symposium 26 (0), 387-390, 2016
The Japan Institute of Electronics Packaging
