Threats and countermeasures for the counterfeit IC - Authentication and traceability using Boundary-Scan -
Bibliographic Information
- Other Title
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- 偽造ICチップの脅威と対策 -バウンダリスキャンによる真贋判定とトレーサビリティ-
Journal
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- Proceedings of JIEP Annual Meeting
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Proceedings of JIEP Annual Meeting 32 (0), 18-20, 2018
The Japan Institute of Electronics Packaging
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Details 詳細情報について
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- CRID
- 1390845713072652032
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- NII Article ID
- 130007627568
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- Text Lang
- ja
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- Data Source
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- JaLC
- CiNii Articles