Hard X-ray Photoemission Spectroscopy at Beamline BL46XU of SPring-8

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  • Oji Hiroshi
    Industrial Application Division, Japan Synchrotron Radiation Research Institute (JASRI) SPring-8 Service, Co. Ltd.
  • Cui Yi-Tao
    Industrial Application Division, Japan Synchrotron Radiation Research Institute (JASRI)
  • Son Jin-Young
    Industrial Application Division, Japan Synchrotron Radiation Research Institute (JASRI) SPring-8 Service, Co. Ltd.
  • Matsumoto Takuya
    Industrial Application Division, Japan Synchrotron Radiation Research Institute (JASRI) SPring-8 Service, Co. Ltd.
  • Koganezawa Tomoyuki
    Industrial Application Division, Japan Synchrotron Radiation Research Institute (JASRI)
  • Yasuno Satoshi
    Industrial Application Division, Japan Synchrotron Radiation Research Institute (JASRI)

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Other Title
  • SPring-8ビームラインBL46XUにおける硬X線光電子分光（HAXPES）
  • SPring-8 ビームライン BL46XU ニ オケル コウXセン コウデンシ ブンコウ(HAXPES)

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<p>  Hard X-ray photoemission spectroscopy (HAXPES) is a relatively new technique that has become practically available recently. HAXPES is now attracting much attention from scientific and industrial researchers as a powerful tool for analyzing the electronic states of the material with the probing depth several times deeper than that of the conventional photoemission spectroscopy (PES). In this article, the principle and the characteristic of HAXPES are outlined with several examples of the researches utilizing this technique. Then two HAXPES measurement systems at BL46XU of SPring-8 equipped with different types of electron spectrometer, i.e., VG-Scienta R4000-10 keV and Focus HV-CSA 300/15 are described in detail. We will also give brief explanation for how to use SPring-8 beamlines.</p>

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