Introduction of Soft X-ray Emission Spectrometer and its Applications
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- TAKAKURA Masaru
- SA Business Unit, JEOL Ltd.
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- KOSHIYA Shogo
- SA Business Unit, JEOL Ltd.
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- MURANO Takanori
- SA Business Unit, JEOL Ltd.
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- TAKAHASHI Hideyuki
- SA Business Unit, JEOL Ltd.
Bibliographic Information
- Other Title
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- 軟X線発光分光器の開発と材料分析事例
- ナンXセン ハッコウ ブンコウキ ノ カイハツ ト ザイリョウ ブンセキ ジレイ
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Abstract
<p>A unique Soft X-ray Emission Spectrometer (SXES) has been developed. This spectrometer can analyse the emission spectrum of the soft X-ray region, based on the electron transition near the valence band, which is sensitive to the chemical bonding state of the material. Also, this spectrometer can detect X-rays in the ultra-soft X-ray region from 50 eV to 2.3 keV with parallel signal detection by using varied line spacing (VLS) gratings.</p><p>In this paper, we will introduce some typical application examples of the analysis of high temperature corrosion of Ni based alloy surface and the polymer analysis.</p>
Journal
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- Vacuum and Surface Science
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Vacuum and Surface Science 64 (11), 510-514, 2021-11-10
The Japan Society of Vacuum and Surface Science
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Details 詳細情報について
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- CRID
- 1390852956485718400
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- NII Article ID
- 130008115414
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- NII Book ID
- AA12808657
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- ISSN
- 24335843
- 24335835
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- NDL BIB ID
- 031821676
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- Text Lang
- ja
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- Data Source
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- JaLC
- NDL
- Crossref
- CiNii Articles
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- Abstract License Flag
- Disallowed