Development of a Suppression Technique of Potential-Induced Degradation by a Formation of Glass Layer in Si PV Modules
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- Huai Go Sian
- Environmental and Renewable Energy Systems Division, Graduate School of Engineering, Gifu University
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- Haga Takahiko
- Department of Electrical, Electronic and Computer Engineering, Faculty of Engineering, Gifu University
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- Ohashi Fumitaka
- Department of Electrical, Electronic and Computer Engineering, Faculty of Engineering, Gifu University
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- Yoshida Hiroki
- Department of Electrical, Electronic and Computer Engineering, Faculty of Engineering, Gifu University
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- Kume Tetsuji
- Department of Electrical, Electronic and Computer Engineering, Faculty of Engineering, Gifu University International Joint Department of Integrated Mechanical Engineering of IITG and GU, the Graduate School of Engineering, Gifu University
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- Nonomura Shuichi
- Gifu Study Center, The Open University of Japan
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抄録
<p>Shunt-type potential-induced degradation (PID) is one of the degradation phenomena of photovoltaic (PV) modules which degrade PV performance drastically in short time compared to other degradation modes. In this paper, a new suppression technique of the PID was developed by coating a glass layer (GL) on the top or bottom surface of cover glass using a chemical solution known as liquid glass. PID tests were conducted using PV modules prepared with and without GL. A clear suppression effects of the PID were observed by forming GL, and the occurrence of the PID was delayed about 4 times by the formation of GL on the bottom side of cover glass in PV modules.</p>
収録刊行物
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- MATERIALS TRANSACTIONS
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MATERIALS TRANSACTIONS 64 (1), 165-170, 2023-01-01
公益社団法人 日本金属学会
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詳細情報 詳細情報について
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- CRID
- 1390857512437415680
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- NII書誌ID
- AA1151294X
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- ISSN
- 13475320
- 13459678
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- NDL書誌ID
- 032589441
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- 本文言語コード
- en
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- データソース種別
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- JaLC
- NDL
- Crossref
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- 抄録ライセンスフラグ
- 使用不可