書誌事項
- タイトル別名
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- A Method for the Analysis of Chromium at Sub-μg L<sup>−1</sup> Level Using a Portable Total Reflection X-ray Fluorescence Spectrometer
抄録
<p>In this study, total reflection X-ray fluorescence (TXRF) spectra of dry residues of 10 μL, 100 µL, 200 µL, and 400 μL droplets of a solution containing 10 μg L−1 of Cr on hydrophobic film coated sample holders were measured by a portable TXRF spectrometer, and these spectra were compared. The net intensity of the Cr Kα peak per the concentration of Cr in the sample solution (counts / μg L−1) increased with an increase in the volume of a droplet of the sample solution. This was because the mass of Cr in the dry residue increased with an increase in the volume of a droplet of the sample solution. This enhancement in the net intensity of the Cr Kα peak per the concentration of Cr led to a significant improvement in the detection limit expressed as the concentration of Cr. Detection limits for Cr obtained from the measurements of the dry residues of 10 μL, 100 µL, 200 µL, and 400 μL droplets of the sample solution were 2.1 μg L−1, 0.30 μg L−1, 0.13 μg L−1, and 0.09 μg L−1, respectively. Measuring the dry residue of a large volume droplet of a water sample would be useful for the analysis of trace elements in the sample.</p>
収録刊行物
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- 鉄と鋼
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鉄と鋼 advpub (0), 2024
一般社団法人 日本鉄鋼協会
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詳細情報 詳細情報について
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- CRID
- 1390862036397604992
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- ISSN
- 18832954
- 00211575
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- 本文言語コード
- ja
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- データソース種別
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- JaLC
- Crossref
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- 抄録ライセンスフラグ
- 使用不可