書誌事項
- タイトル別名
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- Basic Study on Safe Separation Distance of Electronic Circuits Near AC Transmission Lines
- コウリュウソウ デンセン キンボウ ノ デンシ カイロ ノ アンゼン リカク キョリ ニ カンスル キソ ケントウ
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抄録
<p>Electronic devices used in the vicinity of AC overhead transmission lines are often suffered from malfunctions due to high electric field. However, the mechanism of the malfunction has not been clarified. In this paper, a simple electric circuit which is composed of two parts was fabricated and exposed to high electric field to clarify the malfunction occurrence condition. Based on the experiments, the safe separation distance between the electronic circuit and the transmission line was derived as a function of the electric field around the overhead transmission line.</p>
収録刊行物
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- 電気学会論文誌. A
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電気学会論文誌. A 140 (11), 516-521, 2020-11-01
一般社団法人 電気学会
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詳細情報 詳細情報について
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- CRID
- 1391975276374987904
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- NII論文ID
- 130007934060
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- NII書誌ID
- AN10136312
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- ISSN
- 13475533
- 03854205
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- NDL書誌ID
- 030731709
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- 本文言語コード
- ja
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- データソース種別
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- JaLC
- NDL
- Crossref
- CiNii Articles
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- 抄録ライセンスフラグ
- 使用不可