Multi-probe atomic force microscopy with optical beam deflection method
Bibliographic Information
- Other Title
-
- Multi probe atomic force microscopy with optical beam deflection method
- Special issue: Scanning probe microscopy
- Special issue Scanning probe microscopy
Search this article
Description
コレクション : 国立国会図書館デジタルコレクション > デジタル化資料 > 雑誌
Journal
-
- Japanese journal of applied physics. Part. 1, Regular papers, brief communications & review papers : JJAP
-
Japanese journal of applied physics. Part. 1, Regular papers, brief communications & review papers : JJAP 46 (8B), 5636-5638, 2007-08
Tokyo : Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physics
- Tweet
Details 詳細情報について
-
- CRID
- 1520290882185602304
-
- NII Article ID
- 40015552307
-
- NII Book ID
- AA10457675
-
- ISSN
- 00214922
- 13474065
-
- NDL BIB ID
- 8877851
-
- Text Lang
- en
-
- NDL Source Classification
-
- ZM35(科学技術--物理学)
-
- Data Source
-
- NDL Search
- Crossref
- CiNii Articles
- KAKEN
- OpenAIRE