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Chemical Structure Changes in TOPO Capped CdSe Nanocrystals Thin Films by Comparable ToF-SIMS and XPS Study
Bibliographic Information
- Other Title
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- Chemical Structure Changes in TOPO Capped CdSe Nanocrystals Thin Films by Comparable ToF SIMS and XPS Study
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Journal
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- Journal of surface analysis / 表面分析研究会 編
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Journal of surface analysis / 表面分析研究会 編 11 (2), 62-70, 2004-07
東京 : 表面分析研究会
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Details 詳細情報について
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- CRID
- 1520573329988168704
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- NII Article ID
- 40006381100
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- NII Book ID
- AA11448771
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- ISSN
- 13411756
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- NDL BIB ID
- 7063896
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- Text Lang
- en
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- NDL Source Classification
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- ZM35(科学技術--物理学)
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- Data Source
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- NDL Search
- CiNii Articles