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Delay analysis of sub-path on fabricated chips by several path-delay tests
Bibliographic Information
- Other Title
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- Delay analysis of sub path on fabricated chips by several path delay tests
- パスディレイテストを用いた部分パス遅延値推定手法
- VLSI設計技術
- VLSI セッケイ ギジュツ
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Journal
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- 電子情報通信学会技術研究報告 = IEICE technical report : 信学技報
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電子情報通信学会技術研究報告 = IEICE technical report : 信学技報 109 (462), 79-83, 2010-03
東京 : 電子情報通信学会
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Details 詳細情報について
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- CRID
- 1520853834222853120
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- NII Article ID
- 110008001489
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- NII Book ID
- AN10013323
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- ISSN
- 09135685
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- NDL BIB ID
- 10650058
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- Text Lang
- en
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- NDL Source Classification
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- ZN33(科学技術--電気工学・電気機械工業--電子工学・電気通信)
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- Data Source
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- NDL Search
- CiNii Articles