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Enhanced surface sensitivity in secondary ion mass spectrometric analysis of organic thin films using size-selected Ar gas-cluster ion projectiles
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- Enhanced surface sensitivity in secondary ion mass spectrometric analysis of organic thin films using size selected Ar gas cluster ion projectiles
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Journal
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- 兵庫県立大学工学研究科イオン工学研究室論文集 = Annual report of Ion Beam Engineering Laboratory, University of Hyogo
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兵庫県立大学工学研究科イオン工学研究室論文集 = Annual report of Ion Beam Engineering Laboratory, University of Hyogo 2009年度 67-72, 2009
姫路 : 兵庫県立大学工学研究科イオン工学研究室