Imaging of Transition Radiation from Thin Films on a Silicon Substrate Using a Light Detection System Combined with TEM

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タイトル別名
  • Imaging of Transition Radiation from Th
  • Special Issue:Structure Analysis by Using nm-Sized Electron Probe Techniques and Advanced Electron Microscopy
  • Special Issue Structure Analysis by Usi

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収録刊行物

  • Journal of electron microscopy

    Journal of electron microscopy 45 (1), 64-72, 1996

    Oxford : Published for the Japanese Society of Electron Microscopy by Oxford University Press

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