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Examination of the ambient effects on the stability of amorphous indium-gallium-zinc oxide thin film transistors using a laser-glass-sealing technology
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Description
コレクション : 国立国会図書館デジタルコレクション > 電子書籍・電子雑誌 > その他
Journal
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- Research report of Asahi Glass Co., Ltd. = 旭硝子研究報告
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Research report of Asahi Glass Co., Ltd. = 旭硝子研究報告 65 127-130, 2015
横浜 : 旭硝子中央研究所
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Details 詳細情報について
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- CRID
- 1523669555277599360
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- NII Article ID
- 40020618763
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- NII Book ID
- AN00010566
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- ISSN
- 00044210
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- NDL BIB ID
- 026803758
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- Text Lang
- en
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- NDL Source Classification
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- ZP9(科学技術--化学・化学工業--無機化学・無機化学工業--セラミックス・窯業)
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- Data Source
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- NDL Search
- CiNii Articles