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Influences of initial bulk traps on Negative Bias Temperature Instability of HfSiON
Journal
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- Proceedings of International Conference on Solid State Device and Materials, 2005
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Proceedings of International Conference on Solid State Device and Materials, 2005 2005
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Details 詳細情報について
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- CRID
- 1570572700428297472
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- NII Article ID
- 10018156854
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- Data Source
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- CiNii Articles