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C-5-11 Degradation phenomenon of electrical contacts by hammering oscillating mechanisin : inodeling of the oscillating mechanism
Bibliographic Information
- Other Title
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- C-5-11 ハンマリング加振機構による電気接点の劣化現象(第3報) : 加振機構のモデリング(C-5. 機構デバイス,一般セッション)
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Journal
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- Proceedings of the IEICE General Conference
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Proceedings of the IEICE General Conference 2008 (2), 11-, 2008-03-05
The Institute of Electronics, Information and Communication Engineers
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Details 詳細情報について
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- CRID
- 1570572702347186304
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- NII Article ID
- 110006865576
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- NII Book ID
- AN10471452
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- Text Lang
- ja
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- Data Source
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- CiNii Articles