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The Comparison with CDM Test Methods (CDM Method and SCV Method)
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- Maeda Nozomu
- Matsushita Electronics Corporation
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- Kataoka Yoshiharu
- Matsushita Electronics Corporation
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- Matsushita Koichi
- Matsushita Electronics Corporation
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- Wada Tetsuaki
- Matsushita Electronics Corporation
Bibliographic Information
- Other Title
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- デバイス帯電系ESD試験法比較(CDM法・小容量コンデンサー放電法)
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Description
For evaluation of charged device model,there are several test methods of (1) charge and discharge method to package (CDM method), (2) small capacitance C-V method (SCV method).Through the investigation of the comparison with several test methods,the following results were found. 1) Discharge pulse shape depends on discharge method (mechanical or relay switch,with and without socket).Moreover,the discharge pulse shape of SCV method is not equal to that of CDM method. However,the failure mode of SCV method is the same as that of CDM method. 2) In oxide breakdown of main failure mode for charged device model,the destruction voltage under several test methods is equivalent. 3) SCV method can be used as a substitute for CDM method.
Journal
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- IEICE technical report. Reliability
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IEICE technical report. Reliability 93 (334), 39-44, 1993-11-19
The Institute of Electronics, Information and Communication Engineers
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Details 詳細情報について
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- CRID
- 1570572702491112448
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- NII Article ID
- 110003301909
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- NII Book ID
- AN10013243
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- Text Lang
- ja
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- Data Source
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- CiNii Articles