The Comparison with CDM Test Methods (CDM Method and SCV Method)

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Other Title
  • デバイス帯電系ESD試験法比較(CDM法・小容量コンデンサー放電法)

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Description

For evaluation of charged device model,there are several test methods of (1) charge and discharge method to package (CDM method), (2) small capacitance C-V method (SCV method).Through the investigation of the comparison with several test methods,the following results were found. 1) Discharge pulse shape depends on discharge method (mechanical or relay switch,with and without socket).Moreover,the discharge pulse shape of SCV method is not equal to that of CDM method. However,the failure mode of SCV method is the same as that of CDM method. 2) In oxide breakdown of main failure mode for charged device model,the destruction voltage under several test methods is equivalent. 3) SCV method can be used as a substitute for CDM method.

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Details 詳細情報について

  • CRID
    1570572702491112448
  • NII Article ID
    110003301909
  • NII Book ID
    AN10013243
  • Text Lang
    ja
  • Data Source
    • CiNii Articles

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