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Area and time co-optimization for system-on-a-chip based on consecutive testability
Journal
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- IEEE International Test Conference 2003 (ITC'03), Sep.
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IEEE International Test Conference 2003 (ITC'03), Sep. 2003
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Details 詳細情報について
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- CRID
- 1570854175227542016
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- NII Article ID
- 10017115768
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- Data Source
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- CiNii Articles
