- 【Updated on May 12, 2025】 Integration of CiNii Dissertations and CiNii Books into CiNii Research
- Trial version of CiNii Research Knowledge Graph Search feature is available on CiNii Labs
- 【Updated on June 30, 2025】Suspension and deletion of data provided by Nikkei BP
- Regarding the recording of “Research Data” and “Evidence Data”
Impact of Gate Etch Damage and Profile in High Density DRAM Cell
-
- KIM Il-Gweon
- TG4-P9, Memory R&D Division, Hynix Semiconductor Inc.
-
- BAE Jung-wan
- TG4-P9, Memory R&D Division, Hynix Semiconductor Inc.
-
- CHOY Jun-Ho
- TG4-P9, Memory R&D Division, Hynix Semiconductor Inc.
-
- KIM Nam-Sung
- TG4-P9, Memory R&D Division, Hynix Semiconductor Inc.
-
- KWEON Young-Woo
- TG4-P9, Memory R&D Division, Hynix Semiconductor Inc.
-
- CHOI Se-Kyoung
- TG4-P9, Memory R&D Division, Hynix Semiconductor Inc.
-
- KIM Sung-Chul
- TG4-P9, Memory R&D Division, Hynix Semiconductor Inc.
-
- PARK Joo-Seog
- TG4-P9, Memory R&D Division, Hynix Semiconductor Inc.
-
- KIM Ji-Byum
- TG4-P9, Memory R&D Division, Hynix Semiconductor Inc.
Search this article
Journal
-
- Extended abstracts of the ... Conference on Solid State Devices and Materials
-
Extended abstracts of the ... Conference on Solid State Devices and Materials 2001 26-27, 2001-09-25
- Tweet
Details 詳細情報について
-
- CRID
- 1573105974999576192
-
- NII Article ID
- 10015752170
-
- NII Book ID
- AA10777858
-
- Text Lang
- en
-
- Data Source
-
- CiNii Articles