Continuous wave terahertz spectrometer as a noncontact thickness measuring device
Journal
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- Appl. Opt.
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Appl. Opt. 47 3023-3026, 2008
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Details 詳細情報について
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- CRID
- 1573105975982869376
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- NII Article ID
- 10031104387
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- Data Source
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- CiNii Articles