Critical Path Detection of Combinational Circuits in Timing Analysis

  • Yu Xiang Qiu
    Department of Computer Science, Faculty of Engineering, Ehime University
  • Yanagida Nobuhiro
    Department of Computer Science, Faculty of Engineering, Ehime University
  • Takahashi Hiroshi
    Department of Computer Science, Faculty of Engineering, Ehime University
  • Takamatsu Yuzo
    Department of Computer Science, Faculty of Engineering, Ehime University

Bibliographic Information

Other Title
  • 組合せ回路のタイミング解析におけるクリティカル経路の一検出法

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Description

A critical path is the longest sensitizable path in a circuit. We present a method of detecting the critical path for a single path. First, we classify the critical path problem systematically using the equivalent fanout-free form (EFF), and give its detection theory using a path difference of EFF. Next, in order to apply this detection theory to a large-scale circuit, a circuit is divided into sub-tree circuits and an extended EFF which combines the EFFs of the sub-tree circuits is proposed. The path difference of EFF for every sub-tree circuit is performed by the set of the inputs determined by the back operation, and the path difference of the extended EFF is obtained by intersecting those inputs one by one. The results of the preliminary experiment to the benchmark circuits are shown. Finally we refer to the critical path problem for a multiple-path.

Journal

  • IPSJ SIG Notes

    IPSJ SIG Notes 93 (94), 131-138, 1993-10-28

    Information Processing Society of Japan (IPSJ)

Details 詳細情報について

  • CRID
    1573105977036563840
  • NII Article ID
    110002930402
  • NII Book ID
    AN1011091X
  • Text Lang
    ja
  • Data Source
    • CiNii Articles

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