Chemical Durability of AMLCD Glass Substrate. : Corrosion of Glass Substrates by Hydrofluoric and Buffered Hydrofluoric Acids.
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- Miwa Shinkichi
- Technical Division,Nippon Electric Glass
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- Yamamoto Shigeru
- Technical Division,Nippon Electric Glass
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- Onoda Takuhiro
- Technical Division,Nippon Electric Glass
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- Miyamoto Mitsuo
- Chemicals Department for Electronics,Morita Chemical Industries
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- Ishida shoichi
- Chemicals Department for Electronics,Morita Chemical Industries
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- Kita Naohide
- Chemicals Department for Electronics,Morita Chemical Industries
Bibliographic Information
- Other Title
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- AMLCD用ガラス基板の耐薬品性 : 特にフッ酸およびバッファードフッ酸による浸食について
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Description
The chemical durability of AMLCD glass substrates was evaluated with various acids as HCI,HNO_3,H_2SO._24>,HF,Buffered hydrofluoric acid(BHF),and alkali,NaOH.When treated BHF,the surface of the glass substrates turned dim,sometimes.Microscopic obserbation revealed that the dim area corresponded to a lot of tiny hillocks.It has been concluded that there exist an effective composition of BHF as well as a recommendable cleaning condition of glass substrates to prevent the generation of tiny hillocks.
Journal
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- IEICE technical report. Electronic information displays
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IEICE technical report. Electronic information displays 93 (167), 25-31, 1993-07-26
The Institute of Electronics, Information and Communication Engineers
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Keywords
Details 詳細情報について
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- CRID
- 1573105977229964288
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- NII Article ID
- 110003268948
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- NII Book ID
- AN10060775
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- Text Lang
- ja
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- Data Source
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- CiNii Articles