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A MOS Transistor Array for Accurate Measurement of Subthreshold Leakage Variation
Journal
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- 2007 IEEE, Proceedings of the 8^<th> International Symposium on Quality Electronic Design(ISQED'07)
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2007 IEEE, Proceedings of the 8^<th> International Symposium on Quality Electronic Design(ISQED'07) 2007
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Details 詳細情報について
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- CRID
- 1573387449090896256
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- NII Article ID
- 20001075214
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- Data Source
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- CiNii Articles
