Development and Evaluation of the Capacitive Voltage Probe
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- KOBAYASHI Ryuichi
- NTT Technical Assistance & Support Center
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- TAJIMA Kimihiro
- NTT Multimedia Networks Laboratories
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- HIROSIMA Yoshiharu
- NTT Multimedia Networks Laboratories
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- KUWABARA Nobuo
- NTT Multimedia Networks Laboratories
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- HATTORI Mitsuo
- NTT Technical Assistance & Support Center
Bibliographic Information
- Other Title
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- 容量性電圧プローブの開発とその特性
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Description
Recent progress in electronic technology has created high speed and high capability equipment. Therefore, it is important to evaluate EMC characteristics of the electronic equipment. In this report, we describe a new voltage probe that can measure the interference voltage occurred on a cable without touching its conductor. First, basic concept of the capacitive probe and its characteristics are described. Second, measurement error was theoretically and experimentally estimated. The results show that the measurement errors can be calibrated by using theoretical equivalent circuit model. Finally, it is indicated that the influence caused by surrounding can be mitigated by using electrostatic shield.
Journal
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- EMCJ
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EMCJ 98 (102), 9-16, 1998-06-10
The Institute of Electronics, Information and Communication Engineers
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Keywords
Details 詳細情報について
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- CRID
- 1573668927143492096
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- NII Article ID
- 110003190850
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- NII Book ID
- AN10013108
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- Text Lang
- ja
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- Data Source
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- CiNii Articles