- 【Updated on May 12, 2025】 Integration of CiNii Dissertations and CiNii Books into CiNii Research
- Trial version of CiNii Research Knowledge Graph Search feature is available on CiNii Labs
- 【Updated on June 30, 2025】Suspension and deletion of data provided by Nikkei BP
- Regarding the recording of “Research Data” and “Evidence Data”
Analysis of Random Telegraph Signal Noise in Dual and Single Oxide Device And Its Application to CMOS Image Sensor Readout Circuit
-
- LEE Hochul
- Seoul National Univ. Dept. of EE
-
- YOON Youngchang
- Seoul National Univ. Dept. of EE
-
- JEON Jongwook
- Seoul National Univ. Dept. of EE
-
- SHIN Hyungcheol
- Seoul National Univ. Dept. of EE
Search this article
Journal
-
- Extended abstracts of the ... Conference on Solid State Devices and Materials
-
Extended abstracts of the ... Conference on Solid State Devices and Materials 2007 898-899, 2007-09-19
- Tweet
Details 詳細情報について
-
- CRID
- 1574231875379530496
-
- NII Article ID
- 10022551133
-
- NII Book ID
- AA10777858
-
- Text Lang
- en
-
- Data Source
-
- CiNii Articles